FT Test Handler
FT Test Handler
The FT (final test) is a crucial step in IC manufacturing that ensures the quality and reliability of the final product. Our FT equipment is highly effective and precise and supports dual- and triple-temperature testing for enhanced production efficiency and product quality.
SLT Test Handler
SLT Test Handler
The SLT (system-level test) simulates the operating condition in the real-world application environment. It ensures the reliability and performance under various IC working conditions and failure-free functionality in the final product.
Temperature Control Solution
Temperature Control Solution
The temperature control solution is designed for high heat-generating chips and to meet the demand for more precise temperature control. These solutions can include the temperature control system, the temperature monitoring device and temperature regulation, so as to ensure that a steady temperature environment is maintained despite various harsh temperature settings.
Laboratory Development Equipment
Laboratory Development Equipment
The compact size of the machine is fit for engineering development and experimental purposes; precise and reliable testing and handling features are available. Such equipment helps engineers identify and correct issues during the R&D stage, enhance the efficiency of experiments, and ensure product quality and stability.
Flash Test Handler
Flash Test Handler
The flash/memory test handler is one such equipment that is used to test and handle flash storage devices and memories. The machine can test all kinds of memories to ensure their performance and reliability.
DRAM Test Handler
DRAM Test Handler
The DRAM Test Sorting Handler is specifically designed for testing and classifying Dynamic Random Access Memory (DRAM). This equipment performs comprehensive checks on DRAM to ensure it meets strict standards for efficient operation and stability.
Burn-In Oven
Burn-In Oven
A burn-in oven is equipment that tests electronic elements over an extended operating period. The elements are exposed to a high temperature and hence tested for possible issues that may occur in the real-world application, so as to ensure their durability and stability.
COF Test Handler
COF Test Handler
The COF (chip-on-film) test handler is equipment that tests the COF-packaged electronic elements. The machine can test the functionality and performance of COF-packaged electronic elements to ensure their quality and reliability.
AOI Handler
AOI Handler
The AOI (automatic optical inspection) handler is one such equipment that inspects and handles electronic elements by applying optical technologies. The machine can quickly and precisely detect defects and errors of circuit boards and accordingly help enhance production efficiency and quality.
MEMS Test Handler
MEMS Test Handler
MEMS Test Handler is designed specifically for Micro-Electro-Mechanical Systems (MEMS) devices. This equipment can test various types of MEMS components, including Motion Sensors, Microphones, Pressure Sensors, Barometers, etc., to ensure their reliability and accuracy in various applications.